Shelfclass_id |
3.A |
Sortkey |
SIGMETRICS |
Authors |
ACM SIGMETRICS |
Title |
SIGMETRICS 1994: 1994 ACM SIGMETRICS Conference on Measurement and Modeling of Computer Systems: Proceedings: May 16-20, 1994, Vanderbilt University, Nashville, Tennessee, USA |
Publisher |
Association for Computing Machinery |
Year |
1994 |
Languages |
eng |
Isbn |
089791659 |
Series |
ACM |
Volume |
22:1 |
Description |
X xi, 294 p. ill. 28 cm |
Record date |
20120201 |
Location |
New York, N.Y. |
Keywords |
Electronic digital computers, Evaluation, Computer simulation |
Notes |
"Performance Evaluation Review Special issue, Vol. 22 No. 1, May 1994" |