SIGMETRICS 1994: 1994 ACM SIGMETRICS Conference on Measurement and Modeling of Computer Systems: Proceedings: May 16-20, 1994, Vanderbilt University, Nashville, Tennessee, USA

Shelfclass_id 3.A
Sortkey SIGMETRICS
Authors ACM SIGMETRICS
Title SIGMETRICS 1994: 1994 ACM SIGMETRICS Conference on Measurement and Modeling of Computer Systems: Proceedings: May 16-20, 1994, Vanderbilt University, Nashville, Tennessee, USA
Publisher Association for Computing Machinery
Year 1994
Languages eng
Isbn 089791659
Series ACM
Volume 22:1
Description X xi, 294 p. ill. 28 cm
Record date 20120201
Location New York, N.Y.
Keywords Electronic digital computers, Evaluation, Computer simulation
Notes "Performance Evaluation Review Special issue, Vol. 22 No. 1, May 1994"