| Shelfclass_id | 2.Q |
| Sortkey | S+SSPR |
| Authors | Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder |
| Title | S+SSPR 2006: Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006: Proceedings |
| Publisher | Springer-Verlag |
| Year | c2006 |
| Languages | eng |
| Isbn | 3540372369, 9783540372363 |
| Series | Lecture Notes in Computer Science |
| Volume | 4109 |
| Issn | 0302-9743 |
| Description | xxi, 939 p. ill. 24 cm. |
| Record date | 20071107 |
| Location | New York |
| Keywords | Pattern recognition systems |
| Notes | SSPR 2006 was the 11th in a series of conferences; SPR was the 6th in a series of conferences. |
| Urlnote | Restricted to SpringerLink subscribers |
| Urls | http://www.springerlink.com/openurl.asp?genre=issue&issn=0302-9743&volume=4109 |