S+SSPR 2002: Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002: Proceedings

Shelfclass_id 2.Q
Sortkey S+SSPR
Authors Terry Caelli, Adnan Amin, Robert P. W. Duin, Mohammed Kamel, Dick de Ridder
Title S+SSPR 2002: Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002: Proceedings
Publisher Springer-Verlag
Year 2002
Languages eng
Isbn 3540440119
Series Lecture Notes in Computer Science
Volume 2396
Issn 0302-9743
Description xvi, 863 p. ill. 24 cm
Record date 20060626
Location New York
Keywords Pattern recognition systems