Pattern Recognition and Machine Learning: Proceedings of the Japan - U.S. Seminar on the Learning Process in Control Systems, Held in Nagoya, Japan, August 18-20, 1970

Shelfclass_id 2.Q
Sortkey FU, K. S
Authors K. S. Fu
Title Pattern Recognition and Machine Learning: Proceedings of the Japan - U.S. Seminar on the Learning Process in Control Systems, Held in Nagoya, Japan, August 18-20, 1970
Publisher Plenum Press
Year 1971
Languages eng
Isbn 0306305461
Description ix, 343 p illus 26 cm
Record date 20060626
Location New York
Keywords Pattern recognition systems, Self-organizing systems, Machine learning