| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Kevin G. Harding, John W. V. Miller, Bruce G. Batchelor |
| Title | Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology: 7-8 November 2000, Boston, USA |
| Publisher | Spie |
| Year | 2001 |
| Languages | eng |
| Isbn | 0819438545 |
| Series | SPIE Proceedings |
| Volume | 4189 |
| Issn | 1047-9899 |
| Description | vii, 296 p. ill. 28 cm. |
| Record date | 20100820 |
| Location | Bellingham, Wash., USA |
| Nlmed | TA1634 |
| Keywords | Computer vision, Three-dimensional display systems, Quality control, Metrology |