Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Raju V. Datla, Leonard M. Hanssen |
Title | Optical Diagnostic Methods for Inorganic Transmissive Materials: 20-21 July 1998, San Diego, California |
Publisher | SPIE Optical Engineering Press |
Year | 1998 |
Languages | eng |
Isbn | 0819428809 |
Series | SPIE Proceedings |
Volume | 3425 |
Description | vi, 270 p. ill. |
Record date | 20090803 |
Location | Bellingham, Wash., USA |
Keywords | Surfaces (Technology), Inorganic compounds, Optical measurements, Thin films, Refractive index |