Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Editor: Fred H. Pollak |
Title | Spectroscopic Characterization Techniques for Semiconductor Technology II: January 21-22, 1985, Los Angeles, California |
Publisher | SPIE - The International Society for Optical Engineering |
Year | 1985 |
Languages | eng |
Isbn | 0892525592 |
Series | SPIE Proceedings |
Volume | 524 |
Description | vi, 169 p. ill. 28 cm. |
Record date | 20130828 |
Location | Bellingham, Wash. |