| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Tuan Vo-Dinh |
| Title | Advanced Technologies for Environmental Monitoring and Remediation: 6-8 August 1996, Denver, Colorado |
| Publisher | SPIE Optical Engineering Press |
| Year | 1996 |
| Languages | eng |
| Isbn | 0819422231 |
| Series | SPIE Proceedings |
| Volume | 2835 |
| Description | 286 s. |
| Record date | 20090729 |
| Location | Bellingham, Wash., USA |
| Keywords | Teknisk optik, Applied optics |