| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | David Dutton |
| Title | Image Assesment & Specification: May 20-22, 1974 Rochester, New York |
| Publisher | SPIE Optical Engineering Press |
| Year | 1974 |
| Languages | eng |
| Series | SPIE Proceedings |
| Volume | 46 |
| Issn | 1047-9899 |
| Record date | 20100805 |
| Location | Palos Verdes Estates, California |