| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Fiodor F. Sizov |
| Title | Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics: 29 September-2 October 1998, Kiev, Ukraine |
| Publisher | SPIE Optical Engineering Press |
| Year | 1999 |
| Languages | eng |
| Isbn | 0819434914 |
| Series | SPIE Proceedings |
| Volume | 3890 |
| Description | 566 s. |
| Record date | 20090806 |
| Location | Bellingham, Wash., USA |