Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Editor: Andrzej Wlochowicz |
Title | X-Ray Investigations of Polymer Structures II: 2-5 December 1999, Szczyrk, Poland |
Publisher | SPIE - The International Society for Optical Engineering |
Year | 2000 |
Languages | eng |
Isbn | 0819439142 |
Series | SPIE Proceedings |
Volume | 4240 |
Issn | 0277-786X |
Description | x, 88 p. ill. 28 cm. |
Record date | 20130909 |
Location | Bellingham, Wash. |