Shelfclass_id |
S/SPIE |
Sortkey |
S/SPIE |
Authors |
David D. Saperstein |
Title |
Applied Spectroscopy in Material Science: 21-23 January 1991, Los Angeles, California |
Publisher |
SPIE Optical Engineering Press |
Year |
1991 |
Languages |
eng |
Isbn |
0819405272 |
Series |
SPIE Proceedings |
Volume |
1437 |
Issn |
99-0108644 |
Description |
viii, 206 s. |
Record date |
20100810 |
Location |
Bellingham, Wash., USA |
Keywords |
Spektroskopi (Icke-förstörande materialprovning), Spectroscopy (Nondestructive testing of materials), Konferenspublikationer, Conference proceedings |