Nonlinear Image Processing and Pattern Analysis XII: 22-23 January 2001, San Jose, USA

Shelfclass_id S/SPIE
Sortkey S/SPIE
Authors Edward R. Dougherty, Jaakko T. Astola
Title Nonlinear Image Processing and Pattern Analysis XII: 22-23 January 2001, San Jose, USA
Publisher Spie
Year 2001
Languages eng
Isbn 0819439827
Series SPIE Proceedings
Volume 4304
Description vii, 328 p. ill. 28 cm.
Record date 20090820
Location Bellingham, Washington
Keywords Image processing, Digital filters (Mathematics)