| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Dennis M. Mills |
| Title | X Rays in Materials Analysis II: Novel Applications and Recent Developments: 25-26 July 1991, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1991 |
| Languages | eng |
| Isbn | 0819406783 |
| Series | SPIE Proceedings |
| Volume | 1550 |
| Description | 172 s. |
| Record date | 20090721 |
| Location | Bellingham, Wash., USA |
| Keywords | X-ray diffraction, X-ray imaging, Surfaces, Interfaces, Thin films, Röntgenstrukturanalys, Extended X-ray absorption fine structure, Röntgenspektroskopi (Analytisk kemi), X-ray spectroscopy (Analytical chemistry), Röntgenkristallografi, X-ray crystallography, Konferenspublikationer, Conference proceedings |