| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | William S. Chan |
| Title | Advances in Focal Plane Technology: February 4-5, 1980, Los Angeles, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1980 |
| Languages | eng |
| Isbn | 0892522453 |
| Series | SPIE Proceedings |
| Volume | 217 |
| Description | viii, 246 p. ill. 28 cm. |
| Record date | 20090716 |
| Location | Bellingham, Wash. |
| Keywords | Infrared detectors, Infrared imaging, Charge coupled devices, Focal planes |