| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Robert Lee Murrer Jr. |
| Title | Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV: 5-7 April 1999, Orlando, Florida |
| Publisher | SPIE Optical Engineering Press |
| Year | 1999 |
| Languages | eng |
| Isbn | 0819431710 |
| Series | SPIE Proceedings |
| Volume | 3697 |
| Description | 484 s. |
| Record date | 20090902 |
| Location | Bellingham, Wash., USA |