Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Peter M. Rentzepis |
Title | Time-Resolved Electron and X-Ray Diffraction: 13-14 July 1995, San Diego, California |
Publisher | SPIE Optical Engineering Press |
Year | 1995 |
Languages | eng |
Isbn | 0819418803 |
Series | SPIE Proceedings |
Volume | 2521 |
Description | 318 s. |
Record date | 20090728 |
Location | Bellingham, Wash., USA |
Keywords | Diffraktion (Kristallografi), Diffraction (Crystallography), q Conference Proceedings, Diffraktion, Konferenspublikationer, Conference proceedings |