| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Peter M. Rentzepis |
| Title | Time-Resolved Electron and X-Ray Diffraction: 13-14 July 1995, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1995 |
| Languages | eng |
| Isbn | 0819418803 |
| Series | SPIE Proceedings |
| Volume | 2521 |
| Description | 318 s. |
| Record date | 20090728 |
| Location | Bellingham, Wash., USA |
| Keywords | Diffraktion (Kristallografi), Diffraction (Crystallography), q Conference Proceedings, Diffraktion, Konferenspublikationer, Conference proceedings |