| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | David P. Casasent, Tien-Hsin Chao |
| Title | Optical Pattern Recognition VI: 19-20 April 1995, Orlando, Florida |
| Publisher | SPIE Optical Engineering Press |
| Year | 1995 |
| Languages | eng |
| Isbn | 0819418439 |
| Series | SPIE Proceedings |
| Volume | 2490 |
| Description | 466 s. |
| Record date | 20090728 |
| Location | Bellingham, Wash., USA |
| Keywords | Wavelet filters, Neural nets, Optisk mönsteridentifiering, Optical pattern recognition, Konferenspublikationer, Conference proceedings |