| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Katherine Creath, John E. Greivenkamp |
| Title | Interferometry: Surface Characterization and Testing: 24 July 1992, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1992 |
| Languages | eng |
| Isbn | 0819409499 |
| Series | SPIE Proceedings |
| Volume | 1776 |
| Description | 184 s. |
| Record date | 20090722 |
| Location | Bellingham, Wash., USA |
| Keywords | Interferomentri, Interferometry, Teknisk optik, Applied optics, Konferenspublikationer, Conference proceedings |