| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Richard B. Hoover, Mark B. Williams |
| Title | X-Ray and Ultraviolet Sensors and Applications: 13-14 July 1995, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1995 |
| Languages | eng |
| Isbn | 0819418781 |
| Series | SPIE Proceedings |
| Volume | 2519 |
| Issn | 99-0108644 |
| Description | 224 s. |
| Record date | 20100813 |
| Location | Bellingham, Wash., USA |
| Keywords | Ultravioletteknik, Ultraviolet technology, X-ray engineering, Conference proceedings, Röntgenteknik |