| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Clayton C. Williams |
| Title | Scanning Probe Microscopies II: 18-19 January 1993, Los Angeles, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1993 |
| Languages | eng |
| Isbn | 0819410810 |
| Series | SPIE Proceedings |
| Volume | 1855 |
| Record date | 20090723 |
| Location | Bellingham, Wash., USA |
| Keywords | Optical microscopy, Scanning probe microscopes, Scanning probe microscopy, Molecular microscopy, Biomolecular microscopy, Scanning tunneling microscopy, STM, Mikroskopi, Microscopy, Konferenspublikationer, Conference proceedings |