| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Jianquan Yao, Yukihiro Ishii |
| Title | Advanced Materials and Devices for Sensing and Imaging: 17-18 October 2002, Shanghai, China |
| Publisher | SPIE Optical Engineering Press |
| Year | 2002 |
| Languages | eng |
| Isbn | 0819447080 |
| Series | SPIE Proceedings |
| Volume | 4919 |
| Issn | 99-0108644 |
| Description | 548 s. |
| Record date | 20100823 |
| Location | Bellingham, Wash., USA |
| Keywords | Optoelektronik |