| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editor: H. John Caulfield |
| Title | Optical Pattern Recognition II: ECO2: 26-27 April 1989, Paris, France |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1989 |
| Languages | eng |
| Isbn | 0819401706 |
| Series | SPIE Proceedings |
| Volume | 1134 |
| Description | vi, 222 p. ill. 28 cm. |
| Record date | 20130907 |
| Location | Bellingham, Wash. |