Integrating Photogrammetric Techniques with Scene Analysis and Machine Vision: 14-15 April 1993, Orlando, Florida

Shelfclass_id	S/SPIE
Sortkey	S/SPIE
Authors	Eamon B. Barrett, David M. McKeown Jr.
Title	Integrating Photogrammetric Techniques with Scene Analysis and Machine Vision: 14-15 April 1993, Orlando, Florida
Publisher	SPIE Optical Engineering Press
Year	1993
Languages	eng
Isbn	0819411809
Series	SPIE Proceedings
Volume	1944
Issn	99-0108644
Description	286 s.
Record date	20100813
Location	Bellingham, Wash., USA
Keywords	Scene analysis, Machine vision, Cartography, Automatisk databehandling (Fotogrammetri), Electronic data processing (Photogrammetry), Konferenspublikationer, Conference proceedings