| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | David P. Casasent, Tien-Hsin Chao |
| Title | Optical Pattern Recognition X: 7-8 April 1999, Orlando, Florida |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1999 |
| Languages | eng |
| Isbn | 0819431893 |
| Series | SPIE Proceedings |
| Volume | 3715 |
| Description | vii, 416 p. ill. 28 cm. |
| Record date | 20090804 |
| Location | Bellingham, Wash. |
| Keywords | Optical pattern recognition |