| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Manfred Ehlers |
| Title | Remote Sensing for Environmental Monitoring, GIS Applications, and Geology: 18-21 September 2001, Toulouse, France |
| Publisher | SPIE Optical Engineering Press |
| Year | 2002 |
| Languages | eng |
| Isbn | 0819442704 |
| Series | SPIE Proceedings |
| Volume | 4545 |
| Issn | 99-0108644 |
| Description | 330 s. |
| Record date | 20100821 |
| Location | Bellingham, Wash., USA |