| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Kevin G. Harding, John W. V. Miller |
| Title | Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II: 29-30 October 2001, Newton, USA |
| Publisher | SPIE Optical Engineering Press |
| Year | 2002 |
| Languages | eng |
| Isbn | 081944295X |
| Series | SPIE Proceedings |
| Volume | 4567 |
| Issn | 99-0108644 |
| Description | 236 s. |
| Record date | 20100821 |
| Location | Bellingham, Wash., USA |