Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | V. Ralph Algazi, Sadayasu Ono, Andrew G. Tescher |
Title | Very High Resolution and Quality Imaging II: 10-11 February 1997, San Jose, California |
Publisher | SPIE Optical Engineering Press |
Year | 1997 |
Languages | eng |
Isbn | 0819424366 |
Series | SPIE Proceedings |
Volume | 3025 |
Description | 186 s. |
Record date | 20090730 |
Location | Bellingham, Wash., USA |