Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Edwin S. Beckenbach |
Title | Diagnostic Imaging Applications: Held in Conjunction with ECOOSA '84 - The European Conference on Optics, Optical Systems and Applications: 8-9 October 1984, Amsterdam, The Netherlands |
Publisher | SPIE - The International Society for Optical Engineering |
Year | 1984 |
Languages | eng |
Isbn | 0892525517 |
Series | SPIE Proceedings |
Volume | 516 |
Description | vi, 56 p. ill. 28 cm. |
Record date | 20090717 |
Location | Bellingham, Wash., USA |
Keywords | Diagnostic imaging |
Notes | Eight in the SPIE critical review of technology series 8th |