| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Silvano Fineschi |
| Title | X-Ray and Ultraviolet Polarimetry: 15-16 July 1993, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1994 |
| Languages | eng |
| Isbn | 0819412597 |
| Series | SPIE Proceedings |
| Volume | 2010 |
| Description | 230 s. |
| Record date | 20090724 |
| Location | Bellingham, Wash., USA |
| Keywords | Ultraviolet polarimetry, X-ray polamimetry, Polarized synchotron radiations, XUV polarimetry, Polarisation (optik), Polarization (Light), Polarisation, Polarization, Konferenspublikationer, Conference proceedings |