| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Richard B. Hoover, Arthur B. C. Walker Jr. |
| Title | X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry and Projection Lithography: 9-13 July 1990, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1991 |
| Languages | eng |
| Isbn | 0819404047 |
| Series | SPIE Proceedings |
| Volume | 1343 |
| Description | xii, 579 s. |
| Record date | 20090720 |
| Location | Bellingham, Wash., USA |
| Keywords | Telescopes, Multilayer coatings, Spectrographs, Gratings, Mikroskopi, Microscopy, Astronomi, Astronomy, Linser, prismer och speglar (Tillverkning), Lenses, prisms and mirrors (Manufacture), Konferenspublikationer, Conference proceedings |