| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | A. Peter M. Glassford |
| Title | Optical System Contamination: Effects, Measurements, and Control IV: 28-29 July 1994, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1994 |
| Languages | eng |
| Isbn | 0819415855 |
| Series | SPIE Proceedings |
| Volume | 2261 |
| Description | 364 s. |
| Record date | 20090727 |
| Location | Bellingham, Wash., USA |
| Keywords | Teknisk optik, Applied optics, Konferenspublikationer, Conference proceedings |