| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Li Zhu, Cao Hua-Min, Xiong You-Lun, Wu Zhen, Su Chang, Cheng Xian-Ping, Yang Shu-Nian |
| Title | Second International Symposium on Measurement Technology and Intelligent Instruments: Part 1/2: 29 October - 5 November 1993, Wuhan, China |
| Publisher | SPIE Optical Engineering Press |
| Year | 1993 |
| Languages | eng |
| Isbn | 0819413844 |
| Series | SPIE Proceedings |
| Volume | 2101:1/2 |
| Issn | 99-0108644 |
| Description | 2 vol. |
| Record date | 20100813 |
| Location | Bellingham, Wash., USA |
| Keywords | Mätteknik, Measurements (Engineering), Mätinstrument, Measuring instruments, Konferenspublikationer, Conference proceedings |