| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editors: Michael Y. Y. Hung, Ryszard Pryputniewicz |
| Title | Industrial Laser Interferometry II: 27-28 June 1988, Dearborn, Michigan |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1988 |
| Languages | eng |
| Isbn | 0892529903 |
| Series | SPIE Proceedings |
| Volume | 955 |
| Description | vi, 163 p. ill. 28 cm. |
| Record date | 20130902 |
| Location | Bellingham, Wash. |