| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | David M. McKeown Jr., J. Chris McGlone, Olivier Jamet |
| Title | Integrating Photogrammetric Techniques with Scene Analysis and Machine Vision III: 21-23 April 1997, Orlando, Florida |
| Publisher | SPIE Optical Engineering Press |
| Year | 1997 |
| Languages | eng |
| Isbn | 0819424870 |
| Series | SPIE Proceedings |
| Volume | 3072 |
| Issn | 99-0108644 |
| Description | 338 s. |
| Record date | 20100817 |
| Location | Bellingham, Wash., USA |