| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Robert Lee Murrer Jr. |
| Title | Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II: 21-23 April 1997, Orlando, Florida |
| Publisher | SPIE Optical Engineering Press |
| Year | 1997 |
| Languages | eng |
| Isbn | 0819424994 |
| Series | SPIE Proceedings |
| Volume | 3084 |
| Description | 382 s. |
| Record date | 20090730 |
| Location | Bellingham, Wash., USA |