| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editor: Edward M. Granger |
| Title | Metrology of Optoelectronic Systems: 21-22 May 1987, Orlando, Florida |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1987 |
| Languages | eng |
| Isbn | 0892528117 |
| Series | SPIE Proceedings |
| Volume | 776 |
| Description | vi, 123 p. ill. 28 cm. |
| Record date | 20130901 |
| Location | Bellingham, Wash. |