| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | François Danneville, Fabrizio Bonani, Jamal M. Deen, Michael E. Levinshtein |
| Title | Noise in Devices and Circuits II: 26-28 May 2004, Maspalomas, Gran Canaria, Spain |
| Publisher | SPIE Optical Engineering Press |
| Year | 2004 |
| Languages | eng |
| Isbn | 081945396X |
| Series | SPIE Proceedings |
| Volume | 5470 |
| Description | 588 s. |
| Record date | 20090902 |
| Location | Bellingham, Wash., USA |