| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Dennis H. Goldstein, David B. Chenault |
| Title | Polarization: Measurement, Analysis, and Remote Sensing II: 19-21 July 1999, Denver, Colorado |
| Publisher | SPIE Optical Engineering Press |
| Year | 1999 |
| Languages | eng |
| Isbn | 0819432407 |
| Series | SPIE Proceedings |
| Volume | 3754 |
| Description | 426 s. |
| Record date | 20090805 |
| Location | Bellingham, Wash., USA |