International Conference on Photomechanics and Speckle Metrology: Part Two of Two Parts: 17-20 August 1987, San Diego, California

Shelfclass_id S/SPIE
Sortkey S/SPIE
Authors Editor: Fu-Pen Chiang
Title International Conference on Photomechanics and Speckle Metrology: Part Two of Two Parts: 17-20 August 1987, San Diego, California
Publisher SPIE - The International Society for Optical Engineering
Year 1988
Languages eng
Isbn 0892528494
Series SPIE Proceedings
Volume 814:2/2
Description vii, pp. 404-815 ill. 28 cm.
Record date 20130901
Location Bellingham, Wash.