Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Editor: Fu-Pen Chiang |
Title | International Conference on Photomechanics and Speckle Metrology: Part Two of Two Parts: 17-20 August 1987, San Diego, California |
Publisher | SPIE - The International Society for Optical Engineering |
Year | 1988 |
Languages | eng |
Isbn | 0892528494 |
Series | SPIE Proceedings |
Volume | 814:2/2 |
Description | vii, pp. 404-815 ill. 28 cm. |
Record date | 20130901 |
Location | Bellingham, Wash. |