| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Editor: Jean M. Bennett |
| Title | Surface Measurement and Characterization: ECO1: 19-21 September 1988, Hamburg, Federal Republic of Germany |
| Publisher | SPIE - The International Society for Optical Engineering |
| Year | 1989 |
| Languages | eng |
| Isbn | 0819400440 |
| Series | SPIE Proceedings |
| Volume | 1009 |
| Description | viii, 308 p. ill. 28 cm. |
| Record date | 20130906 |
| Location | Bellingham, Wash. |