| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Michael J. Chen |
| Title | High-Speed Inspection Architectures, Barcoding, and Character Recognition: 5-7 November 1990, Boston, Massachusetts |
| Publisher | SPIE Optical Engineering Press |
| Year | 1991 |
| Languages | eng |
| Isbn | 0819404519 |
| Series | SPIE Proceedings |
| Volume | 1384 |
| Description | ix, 355 p. ill. 28 cm |
| Record date | 20060726 |
| Location | Bellingham, Wash., USA |
| Keywords | Quality control, Computer vision, Automatic test equipment, Optical character recognition devices |
| Notes | "Part of a four-conference program on Machine Vision System Integration held at SPIE's Symposium on Advances in Intelligent Systems, a part of OE/Boston '90, 4-9 November 1990, in Boston, Massachusetts"--P. viii |