Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | A. Peter Glassford |
Title | Optical System Contamination: Effects, Measurement, Control III: 23-24 July 1992, San Diego, California |
Publisher | SPIE Optical Engineering Press |
Year | 1992 |
Languages | eng |
Isbn | 0819409278 |
Series | SPIE Proceedings |
Volume | 1754 |
Description | 382 s. |
Record date | 20090722 |
Location | Bellingham, Wash., USA |
Keywords | Teknisk optik, Applied optics, Konferenspublikationer, Conference proceedings |