Shelfclass_id | S/SPIE |
Sortkey | S/SPIE |
Authors | Philip T. Chen, William E. McClintock, Gary J. Rottman |
Title | Optical Systems Contamination and Degradation: 20-23 July 1998, San Diego, California |
Publisher | SPIE Optical Engineering Press |
Year | 1998 |
Languages | eng |
Isbn | 0819428825 |
Series | SPIE Proceedings |
Volume | 3427 |
Description | 488 s. |
Record date | 20090803 |
Location | Bellingham, Wash., USA |