| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | David S. Bomse, Harry Brittain, Stuart Farquharson, Jeremy M. Lerner, Alan J. Rein, Cary Sohl, Terry R. Todd, Lois Weyer |
| Title | Optically Based Methods for Process Analysis: 23-26 March 1992, Somerset, New Jersey |
| Publisher | SPIE Optical Engineering Press |
| Year | 1992 |
| Languages | eng |
| Isbn | 0819408425 |
| Series | SPIE Proceedings |
| Volume | 1681 |
| Issn | 99-0108644 |
| Description | ix, 384 s. |
| Record date | 20100810 |
| Location | Bellingham, Wash., USA |
| Keywords | Pharmaceuptical processes, Mätteknik (Teknisk optik), Measurements (Applied optics), Mätteknik (Kemisk processkontroll), Measurements (Chemical process control), Konferenspublikationer, Conference proceedings |