| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Oswald H. W. Siegmund, Kathryn A. Flanagan |
| Title | EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X: 21-23 July 1999, Denver, Colorado |
| Publisher | SPIE Optical Engineering Press |
| Year | 1999 |
| Languages | eng |
| Isbn | 0819432512 |
| Series | SPIE Proceedings |
| Volume | 3765 |
| Description | 838 s. |
| Record date | 20090805 |
| Location | Bellingham, Wash., USA |