| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Aland K. Chin, Niloy K. Dutta, Kurt J. Linden, S. C. Wang |
| Title | Testing, Reliability, and Applications of Optoelectronic Devices: 24-26 January 2001, San Jose, USA |
| Publisher | Spie |
| Year | 2001 |
| Languages | eng |
| Isbn | 0819439630 |
| Series | SPIE Proceedings |
| Volume | 4285 |
| Description | xxxii, 246 p. ill. 28 cm. |
| Record date | 20090820 |
| Location | Bellingham, Washington |
| Keywords | Optoelectronic devices |