| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Randolph E. Longshore, Jan W. Baars |
| Title | Growth and Characterization of Materials for Infrared Detectors: 15-16 July 1993, San Diego, California |
| Publisher | SPIE Optical Engineering Press |
| Year | 1993 |
| Languages | eng |
| Isbn | 0819412708 |
| Series | SPIE Proceedings |
| Volume | 2021 |
| Issn | 99-0108644 |
| Description | 234 s. |
| Record date | 20100813 |
| Location | Bellingham, Wash., USA |
| Keywords | Detector materials, Silicon substrates, Quantum wells, Superlattices, Infrared materials, IR materials, Infraröddetektorer, Infrared detectors, Konferenspublikationer, Conference proceedings |