Image Processing, Analysis, Measurement, and Quality: Part of SPSE's International Symposium and Exposition on Electronic Imaging Devices and Systems '88: 13-15 January 1988, Los Angeles, California: [P. 2]

Shelfclass_id	S/SPIE
Sortkey	S/SPIE
Authors	Gary W. Hughes, Patrick E. Mantey, Bernice E. Rogowitz, Andras I. Lakatos
Title	Image Processing, Analysis, Measurement, and Quality: Part of SPSE's International Symposium and Exposition on Electronic Imaging Devices and Systems '88: 13-15 January 1988, Los Angeles, California: [P. 2]
Publisher	SPIE Optical Engineering Press
Year	1988
Languages	eng
Isbn	0892529369
Series	SPIE Proceedings
Volume	901
Issn	99-0108644
Description	vi, 270 s.
Record date	20100807
Location	Bellingham
Keywords	Bildbehandling, Image processing, Konferenspublikationer, Conference proceedings