| Shelfclass_id | S/SPIE |
| Sortkey | S/SPIE |
| Authors | Leonard M. Hanssen |
| Title | Optical Diagnostic Methods for Inorganic Materials II: 3-4 August 2000, San Diego, USA |
| Publisher | SPIE Optical Engineering Press |
| Year | 2000 |
| Languages | eng |
| Isbn | 0819437433 |
| Series | SPIE Proceedings |
| Volume | 4103 |
| Issn | 99-0108644 |
| Description | 188 s. |
| Record date | 20100820 |
| Location | Bellingham, Wash., USA |